Characteristics of EDEADI-based perovskite films and devices (IMAGE)
Caption
(A) SEM tomography image of target films. The scale bars represent 500 nm.
(B) Cross-sectional SEM tomography image of target devices. The scale bars represent 500 nm.
(C) Cross-sectional SEM tomography image at high magnification. The scale bars represent 100 nm.
(D) XRD spectra of target films.
(E) TRPL curves of target films.
(F) EQE as a function of current density for target devices. The insert is the EL spectra at different biases.
(G) Current density and radiance as a function of voltage for target devices.
(H) Stability of devices measured at a constant current density of 100 mA cm−2.
(I) Reported lifetimes under high excitation, peak EQE, and peak radiance of various devices according to the data provided in Table S2.
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