GIWAXS and GISAXS measurements. (IMAGE)

The Hong Kong Polytechnic University

GIWAXS and GISAXS measurements.

Caption

2D GIWAXS diffraction patterns of the PM6:BTP-eC9 (a), PM6:o-BTP-eC9 (b) and ternary (c) blend films. The related 1D GIWAXS line cut profiles along IP (d) and OOP (e) directions. f 1D GISAXS profiles along qr direction. 2D GISAXS diffraction patterns of the PM6:BTP-eC9 (g), PM6:o-BTP-eC9 (h) and ternary (i) blend films. Source data are provided as a Source Data file.

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© 2024 Research and Innovation Office, The Hong Kong Polytechnic University. All Rights Reserved.

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