AlScN storage device (IMAGE) University of Pennsylvania Caption The memory device consists of a metal–insulator–metal structure, incorporating nickel and platinum electrodes with a thin (45 nanometers) layer of Alumnium Scandium Nitride. Credit University of Pennsylvania Usage Restrictions Request permission to redistribute from photographer, Eric Sucar at U Penn. License Original content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.