Glovebox-Assisted Magnetic Force Microscope Offers Easier Image of Air-Sensitive Samples (IMAGE)

Hefei Institutes of Physical Science, Chinese Academy of Sciences

Glovebox-Assisted Magnetic Force Microscope Offers Easier Image of Air-Sensitive Samples

Caption

Topography and MFM images of the CrI3 bulk crystal at 5 K and in fields up to 11.9 T.

Credit

ZHANG Yuchen

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