Electrical Transport Measurements (image) Tokyo Institute of Technology Share Print E-Mail Caption This is a schematic figure of the four-point probe used for analyzing the electron transport properties in ultrahigh vacuum. The superconductor is one unit-layer (UL) NbSe2 grown on a bilyer graphene (BLG) on SiC substrate. Credit Physical Review B Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.