Impacts of Resistance-limiting Factors (image) University of Tokyo Share Print E-Mail Caption The research results show that the roughness of the SiC interface has little effect in limiting resistance, while charges under the SiC interface and atomic vibration are dominant factors. Credit 2017 Mitsubishi Electric Corporation. Usage Restrictions In relation to the news release only. Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.