Test Chamber in Time-Of-Flight Secondary Ion Mass Spectrometer (image) Chalmers University of Technology Share Print E-Mail Caption Test chamber in the time-of-flight secondary ion mass spectrometer (ToF-SIMS) in which the skin samples are exposed to ion beams. The samples are analysed in an ultra-high vacuum to avoid disruption. Credit Mats Tiborn Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.