Arbitrary Alignment Pattens Generated by Spatial and Temporal Scanning of Light (image) Tokyo Institute of Technology Share Print E-Mail Caption A represents a schematic illustration of the desired patterns of alignment. B represents irradiated light patterns of expanding toroid shapes, periodic dots, and the words Tokyo Tech. C represents POM images under crossed polarizers. Credit Atsushi Shishido, Tokyo Institute of Technology Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.