Deep-subwavelength Dielectric Multilayer Structure and Experimental Apparatus (image) The City University of New York Share Print E-Mail Caption The multilayer stack is grown on a prism and covered with an absorbing Pt layer. A laser beam is incident at angle q on the prism, and the output reflection is measured by a charge-coupled device. Credit Azriel Genack Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.