ultrahigh-vacuum atomic force microscope (IMAGE)

DOE/Oak Ridge National Laboratory

ultrahigh-vacuum atomic force microscope

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Using the ultrahigh-vacuum atomic force microscope at DOE’s Center for Nanophase Materials Sciences at ORNL, researchers found unique environmentally induced ferroelectric phase transitions in hafnium zirconium oxide, a material important in developing advanced semiconductors.

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Arthur Baddorf/ORNL, Dept. of Energy

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