ZEISS and ORNL sign licensing agreement (IMAGE)

DOE/Oak Ridge National Laboratory

ZEISS and ORNL sign licensing agreement

Caption

ZEISS Head of Additive Manufacturing Technology Claus Hermannstädter, left, and ORNL Interim Associate Laboratory Director for Energy Science and Technology Rick Raines sign a licensing agreement that allows ORNL’s machine-learning algorithm, Simurgh, to be used for rapid evaluations of 3D-printed components with industrial X-ray computed tomography, or CT. Using machine learning in CT scanning is expected to reduce the time and cost of inspections of 3D-printed parts by more than ten times while improving quality.

Credit

Carlos Jones/ORNL, U.S. Dept. of Energy

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