Microscopy (IMAGE)

DOE/Sandia National Laboratories

Microscopy

Caption

Sandia National Laboratories researcher Ryan Schoell uses a specialized transmission electron microscope technique developed by Khalid Hattar, Dan Bufford and Chris Barr to study fatigue cracks at the nanoscale.

Credit

Craig Fritz, Sandia National Laboratories

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For news reporting purposes only. All other uses must receive express permission from Sandia National Laboratories.

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