Automating the surface analysis of physical vapor deposited semiconductor film using machine learning. (IMAGE)

Tokyo University of Science

Automating the surface analysis of physical vapor deposited semiconductor film using machine learning.

Caption

Reflection high-energy electron diffraction (RHEED) is an imaging technique widely used to analyze the surface structures of materials grown via physical vapor deposition. However, RHEED produces huge amounts of data and is a skill-intensive tool to use. To address this issue, TUS and NIMS scientists employ machine learning techniques to automate some of the harder parts of the analysis.

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Naoka Nagamura from National Institute for Materials Science and Tokyo University of Science

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