Concept illustration (IMAGE) Optica Caption Researchers have developed a new measurement and imaging approach that can resolve nanostructures smaller than the diffraction limit of light. After light interacts with a sample, the new technique measures the light intensity as well as other parameters encoded in the light field. Credit Jörg S. Eismann, University of Graz Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.