Multilayer Laue Lens-Based X-ray Microscope (IMAGE)
Caption
Brookhaven physicists Yong Chu (left) and Evgeny Nazaretski led the project to develop the first multilayer Laue lens-based microscope, which is installed at the Hard X-ray Nanoprobe beamline at Brookhaven's National Synchrotron Light Source II.
Credit
Brookhaven National Laboratory
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