Multilayer Laue Lens-Based X-ray Microscope (IMAGE) DOE/Brookhaven National Laboratory Caption Brookhaven physicists Yong Chu (left) and Evgeny Nazaretski led the project to develop the first multilayer Laue lens-based microscope, which is installed at the Hard X-ray Nanoprobe beamline at Brookhaven's National Synchrotron Light Source II. Credit Brookhaven National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.