Figure 1 | Characterizing the optical performance of the proposed VUV-based photoemission microscopy (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 1 | Characterizing the optical performance of the proposed VUV-based photoemission microscopy

Caption

(a) Illustration of the laser beam going through the KBBF crystal (top) and the flat lens (middle); (b) microscopic image of the flat lens etched on a CaF2 substrate (insert: photo of the optical device); (c) Measurement of the focal spot. The experimental profiles of focal spots near the focal plane are measured by knife-edge scanning. Based on the profiles at the different z-cut planes, the lateral (x- and y-direction) intensity profiles of the real spot are retrieved by our homemade algorithm and then yield the spot size (FWHM) labelled by red (x-direction) and green (y-direction) circles (d) Microscopic image and (e) scanning transmission image of a graphene sample on a CaF2 substrate.

Credit

by Yuanhao Mao, Dong Zhao, Shen Yan, Hongjia Zhang, Juan Li, Kai Han, Xiaojun Xu, Chuan Guo, Lexian Yang, Chaofan Zhang, Kun Huang, Yulin Chen

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