SISTM Image (IMAGE)

DOE/Brookhaven National Laboratory

SISTM Image

Caption

This image produced by the Spectroscopic Imaging Scanning Tunneling Microscope reveals the location of every atom on the surface, as well as every single atomic defect in the field of view. The white dots making up squares arrayed 45-degrees to the x/y-axis are selenium (Se) atoms, while the defects--missing Fe atoms in the Fe plane, about a quarter of a nanometer below the Se surface--show up as butterfly-shaped perturbations produced by quantum interference of electrons scattering from the defects. These scattering interference patterns led to the discovery of orbital selective Cooper pairing in FeSe.

Credit

Brookhaven Lab/Cornell U

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