A False-Colored Ultrafast Electron Microscope (UEM) Snapshot of a Thin Semiconducting Crystal (IMAGE)

University of Minnesota

A False-Colored Ultrafast Electron Microscope (UEM) Snapshot of a Thin Semiconducting Crystal

Caption

This is a false-colored ultrafast electron microscope (UEM) snapshot of a thin semiconducting crystal. The image was captured with an extremely fast shutter lasting only a few hundred femtoseconds (a millionth of a billionth of a second).

Credit

College of Science and Engineering, University of Minnesota

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