图1 (IMAGE) Science China Press Caption (a) 芯片的晶体管数量、运算速度和电子产品尺寸随年份的变化 [1]; (b) 100 nm锰氧化物纳米线形貌图 [2]; (c) 不同宽度纳米线淬火无序效应的电学输运表征 [2] Credit ©《中国科学》杂志社 Usage Restrictions Use with credit. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.