First-generation NEMS/mass Spectrometry System (IMAGE)

California Institute of Technology

First-generation NEMS/mass Spectrometry System

Caption

This photo shows scanning electron micrographs showing one of the doubly-clamped beam NEMS devices used in these experiments. It is embedded in a nanofabricated three-terminal UHF bridge circuit.

Credit

Fabricated by Akshay Naik and Selim Hanay in the Roukes lab and the Kavli Nanoscience Institute/Caltech.

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