Scanning Photocurrent Imaging Microscopy Provided Direct Measurements of Perovskite Properties (IMAGE)

Case Western Reserve University

Scanning Photocurrent Imaging Microscopy Provided Direct Measurements of Perovskite Properties

Caption

This is a schematic of scanning photocurrent imaging microscopy of halide perovskite film (side view). Using the technique, researchers found the diffusion length within a well-oriented perovskite film measured up to 20 micrometers.

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Courtesy of Nano Letters

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