Reviewing Charts (IMAGE) Georgia Institute of Technology Caption Georgia Tech researchers illustrate how their new statistical technique improves measurement of nanostructure properties by correcting data errors. Shown (left to right) are Zhong Lin Wang, V. Roshan Joseph, C.F. Jeff Wu and Xinwei Deng. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.