Figure 1 (IMAGE)

Science China Press

Figure 1

Caption

(a) An atomic force microscope image of a typical ZrTe5 device. The scale bar represents 10 μm. (b) A schematic of the measurement configuration of in-plane Hall signal. The current I is along the crystalline a axis of the ZrTe5 device. The magnetic field B rotates in the ac plane. θ denotes the angle between the magnetic field and the current. θ=0° and 90° correspond to B?I and B?I, respectively. (c) The symmetric component of the in-plane Hall signal. (d) The asymmetric component of the in-plane Hall signal.

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