Successful Real-Time Observation Of Atomic Motion with Sub-Nanometer Resolution (1/3) (IMAGE)
Caption
Figure 1: (upper) A schematic representation of the pump-probe time-resolved x-ray diffraction technique. After irradiation of the sample by a near-infrared excitation pulse (red color), an XFEL pulse (blue) delayed by a time τ irradiates the sample and the resulting changes in the diffraction peak intensity and position are recorded by the multi-port CCD (MPCCD). ω represents the rotation of the sample. (lower) Frames (I) to (III) show schematic changes in the Ge2Sb2Te5 single crystal induced by the femosecond excitation. Ge atoms are shown in yellow, Te atoms in blue, and Sb atoms are shown in purple.
Credit
University of Tsukuba
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