Accuracy of phenological dates simulated by the original and improved models (IMAGE)

Science China Press

Accuracy of phenological dates simulated by the original and improved models

Caption

This is the simulation accuracy of anthesis (a) and maturity (b) dates by the original (CERES-Wheat) and improved (CERES-Wheat-WE) models. Values denotes the root mean square error (RMSE) or low-temperature degree days (LDD) of each phenological date in each wheat planting region. NCP, North China Plain; NW, northwestern China; SW, southwestern China; YG, Yunnan-Guizhou Plateau; YZ, Middle-Lower Yangtze Plain.

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