High-Energy Diffraction Microscopy Experiments (IMAGE) American Institute of Physics Caption This setup is used for high-energy diffraction microscopy experiments -- it involves a rotational and axial motion system load frame insert in a conventional load frame along with near-field and far-field detectors. The loading axis is vertical, and the specimen and specimen grips rotate around the loading axis while the rest of the setup remains stationary. Credit Review of Scientific Instruments Usage Restrictions This image may be used only with appropriate caption and credit. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.