Heteorjunction cell (IMAGE)

Helmholtz-Zentrum Berlin für Materialien und Energie

Heteorjunction cell

Caption

A conductive AFM tip is used to scan the sample surface of an a-Si:H/c-Si interface under ultra-high vacuum on the nm scale, revealing the transport channels of the charge carriers via defects in the a-Si:H (red states in the magnified section).

Credit

Martin Künsting /HZB

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