SEM of 3-D Nanomagnetic Logic Gate (IMAGE) Technical University of Munich (TUM) Caption This image shows scanning electron micrographs of a 3-D majority logic gate showing the scale of the computing area ,with dimensions less than 200 nanometers, and, in cross-section, the lower position of the third input magnet. Credit I. Eichwald/TUM Usage Restrictions This image may be freely used, with copyright noted, in news coverage of TUM. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.