Electrons Tunneling, Near and Far (1 of 4) (IMAGE)

American Association for the Advancement of Science (AAAS)

Electrons Tunneling, Near and Far (1 of 4)

Caption

This is a conceptual illustration of surface property measurement with atomic resolution using a scanning tunneling microscope. When the single atom tip of the STM is extremely close to the surface a tunneling current can be measured providing atomic resolution. This image relates to an article that appeared in the Sept. 11, 2009, issue of Science, published by AAAS. The study, by Dr. H. Akagi at University of Ottawa in Ottawa, Ontario, Canada and colleagues, was titled, "Laser Tunnel Ionization from Multiple Orbitals in HCl."

Credit

[Image courtesy of National Research Council of Canada]

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