A Focus Ion Beam Milling Microscope (IMAGE) Chalmers University of Technology Caption This is a sample holder inside a focus ion beam (FIB) milling microscope used to create thin foils for transmission electron microscopy (TEM) studies. Credit Johan Bodell/Chalmers University of Technology Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.