Simulations of Different Types of Scanning Probe Microscopy with Atomic-Scale Sensors (IMAGE)

Forschungszentrum Juelich

Simulations of Different Types of Scanning Probe Microscopy with Atomic-Scale Sensors

Caption

Left: This is a simulated atomic force microscopy image. In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), measuring the force gradient, i.e. the change of force with distance between tip and sample. Centre: Simulated scanning tunnelling microscopy image In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), recording the resulting tunneling current between tip and sample surface. Right: Simulation of an inelastic electron tunnelling spectroscopy image In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), detecting shifts in the vibrational frequency of the sensor particle oscillating against the tip.

Credit

Source: Hapala/Temirov/Tautz/Jel&#237;nek, <i>Physical Review Letters</i>, Copyright 2014 by The American Physical Society

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