Ear of Corn Infected With Corn Smut (IMAGE) Donald Danforth Plant Science Center Caption Smut fungi are agents of disease responsible for significant crop losses worldwide. Principal Investigator, Dr. Thomas Smith and Research Associate Member, Dr. Dilip Shah at The Donald Danforth Plant Science Center collaborated on a project to develop a variety of corn that is highly resistant to corn smut caused by the fungus, Ustilago maydis. Credit Donald Danforth Plant Science Center Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.