High-Resolution Transmission Electron Microscopy Image (IMAGE)

Lobachevsky University

High-Resolution Transmission Electron Microscopy Image

Caption

High-resolution transmission electron microscopy image (a) and schematic (b) of the cross-section of the multi-layer memristive structure in the region of the conducting filament (CF), the dependence of resistive states on the number of switching cycles and a photograph of the memristive chip with memristive microdevices (c)

Credit

Lobachevsky University

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