Atom Trap Trace Analysis (IMAGE) DOE/Argonne National Laboratory Caption A new technique developed at Argonne, called Atom Trap Trace Analysis, or ATTA, is an ultrasensitive way to detect single atoms in a large sample. The technique can help date older samples much more effectively than carbon-14 dating. Chun-Yen Chen aligns the atom trap's optics. Argonne National Laboratory photo. Credit Courtesy: Argonne National Laboratory Usage Restrictions Image available for use with an Argonne acknowledgement. Image may not be used for advertising or other commercial purposes, or in such a way as to imply an endorsement of any product or service by Argonne National Laboratory. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.