Responses of PZT Thin Film Properties to Applied Electric Field (IMAGE)

Tokyo Institute of Technology

Responses of PZT Thin Film Properties to Applied Electric Field

Caption

The (a-f) capacitance, strain, tilting angle, intensity, difference capacitance, and volume fraction of the c domain were measured as functions of time, respectively. The elastic deformation and ferroelastic domain switching were completed within 40 ns.

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Scientific Reports

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