Broadband Electrostatic Force Microscop (IMAGE)

University College London

Broadband Electrostatic Force Microscop

Caption

The secrets of the tiniest active structures in integrated circuits can be revealed using a non-destructive imaging technique, shows an international team of scientists from JKU and Keysight Technologies (Austria), ETH/EPFL/PSI and IBM Research - Europe (Switzerland) and from UCL (UK).

Credit

Curson et al.

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Credit is given

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