Advanced Sample Characterization on the Nanoscale Reveals Microscopic Electrical Fields (IMAGE)

Karlsruher Institut für Technologie (KIT)

Advanced Sample Characterization on the Nanoscale Reveals Microscopic Electrical Fields

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Advanced sample characterization on the nanoscale reveals microscopic electrical fields (i.e. ferroelectric do-mains) in MAPbI3 perovskite thin-films. (Photo: Alexander Colsmann, Holger Röhm, Tobias Leonhard, KIT)

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Alexander Colsmann, Holger Röhm, Tobias Leonhard, KIT

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