Schematic diagram of potential sources of thermal runaway hazards in silicon-carbon material. (IMAGE)
Caption
Scientists from Southeast University, Physcience Golden Silicon New Material Technology Co., Ltd. and Contemporary Amperex Technology Co., Ltd. proposed a schematic diagram of potential sources of thermal runaway hazards in Si-C materials, to better visualise the exothermic reaction between Si-C anode and electrolyte.
Credit
Xin-Bing Cheng, Southeast University.
Usage Restrictions
News organizations may use or redistribute this image, with proper attribution, as part of news coverage of this paper only.
License
Original content