Three-dimensional view of the alternating current potential drop method (ACPDM) measurement setup (IMAGE)

Advanced Devices & Instrumentation

Three-dimensional view of the alternating current potential drop method (ACPDM) measurement setup

Caption

Comparison of the measurement results (dots) and simulation results (solid line) for the defect-induced change for a PDM setup of case 4 as a function of the crack depth.

Credit

Advanced Devices & Instrumentation

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