Overview of this study (IMAGE)

Japan Science and Technology Agency

Overview of this study

Caption

The left side illustrates a schematic of electric field observation of the space charge layer at the grain boundary. An electron beam tilted at various angles (tilt-scan-averaged electron beam) scans the sample (yellow cuboid with a grain boundary indicated by gray regions) at multiple points. When an electric field due to the space charge layer exists within the sample, the transmitted electrons deflect rightward due to Coulomb force. The right side shows an experimental electric field image of the YSZ grain boundary.

Credit

Satoko Toyama

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