Machine learning architecture (IMAGE) Beijing Institute of Technology Press Co., Ltd Caption (A) Inverse control architecture, which can reproduce the strain field by inputting target strain field images. (B) Forward control architecture, which can predict the strain field by inputting the voltage input array for DEA array. Credit Jue Wang, School of Mechanical Engineering, Purdue University. Usage Restrictions News organizations may use or redistribute this image, with proper attribution, as part of news coverage of this paper only. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.