Electron Microscopy Image (IMAGE) DOE/Brookhaven National Laboratory Caption Scientists at the Center for Functional Nanomaterials used transmission electron microscopy to analyze the elemental makeup of materials comprising quantum devices. The above image shows that there is no oxide between the tantalum (Ta) and aluminum (Al) layers. This indicates that there is good metal-to-metal contact, which is important for quantum devices exhibiting high coherence. Credit Brookhaven National Laboratory Usage Restrictions ok to use for purposes related to this research License Original content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.