Polycrystalline perovskite X-ray flat panel detector prototype with suppressed capacitances and its imaging performance comparison. (IMAGE)

Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences

Polycrystalline perovskite X-ray flat panel detector prototype with suppressed capacitances and its imaging performance comparison.

Caption

Figure. (a) Polycrystalline perovskite X-ray flat panel detector prototype with suppressed bulk parasitic capacitance and interface drift capacitance. (b) Comparison of X-ray imaging before and after capacitance suppression. (c) The unique interface drift capacitance caused by wide changes in the interface junction width in semiconductors with high intrinsic ion concentration and a soft lattice. (Image by SIAT)

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LI Yunlong

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