Eye-catching image (IMAGE)
Caption
Three-dimensional atomic force microscopy (3D-AFM) map underlining its capability to
image suspended flexible samples above a regular pattern of nano-sized dots.
Credit
© 2024 Mohammad Shahidul Alam, et al., Small Methods published by Wiley-VCH GmbH
Usage Restrictions
Credit must be given to the creator. Only noncommercial uses of the work are permitted.
License
CC BY-NC