Reliable wafer-scale integration of two-dimensional materials and metal electrodes with van der Waals contacts (IMAGE)

University of Science and Technology of China

Reliable wafer-scale integration of two-dimensional materials and metal electrodes with van der Waals contacts

Caption

Illustration of electrode transfer and the all-stacking method.

Credit

Xiaodong Zhang et al.

Usage Restrictions

None

License

Original content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.