Figure. The concept of developing a 3D polycrystalline model from scanning electron microscopy (SEM) images acquired in a tomographic manner using a focused ion beam (FIB). (IMAGE)
Caption
The left side of the figure schematically shows how a series of two-dimensional scanning electron microscopy images of an ultrafine-grained Nd-Fe-B magnet were transformed into a three-dimensional model in which each individual convex grain is distinguished with an individual color. On the right side of the figure, an idea of micromagnetic simulations on the developed model is demonstrated in schematics. There is a scanning electron microscope image with highlighted grain contours. Part of this image is superimposed with results of micromagnetic simulations, namely with the vector field of magnetization and with colored grains in red/blue indicating the top/bottom projected magnetization of the grains. The idea is that the micromagnetic simulations are able to reveal how the magnetization is distributed in a real microstructure of permanent magnets and how the magnetization reversal occurs.
Credit
Tadakatsu Ohkubo National Institute for Materials Science
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